End user test

Toggle test mode +UTEST=0, +UTEST=1

+UTEST=0

Modules

LEXI-R10401D-00B LEXI-R10801D-00B

Attributes

Syntax

PIN required

Settings saved

Can be aborted

Response time

Error reference

partial

No

No

No

Up to 1 s

+CME Error

Description

Enables the production test (or non-signaling) mode or returns to the normal (signaling) operating mode. The AT+UTEST=0 command exits production test mode, while AT+UTEST=1 enters it.

Signaling mode is the default operating state after boot: the protocol stack is operating and the module can connect to the cellular network normally. In non-signaling mode, the module switches off the protocol stack for running tests which could not otherwise be performed.

In signaling mode:

  • The only allowed +UTEST command is the AT+UTEST=1 used to enable the testing interface

  • All other +UTEST commands return an error result code (“+CME ERROR: operation not allowed” or “+CME ERROR: 3” depending on the +CMEE AT command setting)

To enter production test mode:

  • deactivate the protocol stack issuing the AT+CFUN=0 command before entering the non-signaling mode.

To return to the normal mode, perform one of these actions:

  • a module reset

  • power off the module

  • send AT+UTEST=0 (depending on the module series, a reboot could be automatically performed)

When the module returns the normal mode, the network registration status stored in the profile will be restored. Use the AT+CFUN=1 command to restore the module full functionality.

Syntax

TypeSyntaxResponseExample

Generic syntax

Set

AT+UTEST=<mode>

[+UTEST: <mode>]

OK

AT+UTEST=0

OK

Entering normal mode

Set

AT+UTEST=0

OK

AT+UTEST=0

OK

Entering test mode

Set

AT+UTEST=1

OK

AT+UTEST=1

OK

Read

AT+UTEST?

+UTEST: <mode>

OK

+UTEST: 1

OK

Test

AT+UTEST=?

+UTEST: (list of supported <mode>s)

OK

+UTEST: (0-4)

OK

Defined values

ParameterTypeDescription

<mode>

Number

Test mode setting:

  • 0: the module returns to the normal mode

  • 1: the module enters the test mode

Digital pins testing +UTEST=10

+UTEST=10

Modules

LEXI-R10401D-00B LEXI-R10801D-00B

Attributes

Syntax

PIN required

Settings saved

Can be aborted

Response time

Error reference

partial

No

No

No

Up to 1 s

+CME Error

Description

Performs functional testing on the digital pins of the module.

The module pins can be considered as generic digital input / output pins; it is possible to configure one pin as a digital output with “high” logic level and then verify the voltage level present. Conversely, it is possible set a pin as a digital input, externally apply a “high” or “low” logic level, and then check if the module is able to correctly measure the voltage level applied.

This command is intended for production or prototype testing: to check the correct digital pins behavior and to detect possible soldering or functional problems. The execution of these actions is performed only in non-signaling mode. If the module has not been set into non-signaling mode (with AT+UTEST=1) prior to using +UTEST=10, this command will return “+CME ERROR: operation not allowed” or “+CME ERROR: 3” error result code, depending on the +CMEE AT command setting.

Do not exceed the values reported in the Generic Digital Interface section of the module data sheet when testing a pin as a digital input pin, since stressing the device above the listed ratings may cause a permanent damage to the module.

The command only accepts the parameter set supported by the specific module version. When an unsupported parameter is issued, an error result code will be provided (“+CME ERROR: operation not supported” or “+CME ERROR: 4” depending on the +CMEE AT command setting).

For more details on test command examples, guidance about test equipment setup and more information on module reboot see the application development guide and the corresponding data sheet for pins levels characteristics.

Syntax

TypeSyntaxResponseExample

Digital pins testing generic syntax

Set

AT+UTEST=10,<op_code>[,[<bit_padding>]<pin_seq>]

OK

AT+UTEST=10,3,"0000001000000300"

OK

Restoring original configuration

Set

AT+UTEST=10,0

OK

AT+UTEST=10,0

OK

Pins set definition

Set

AT+UTEST=10,2,[<bit_padding>]<pin_seq>

OK

AT+UTEST=10,2,"0000000C300000003000"

OK

Pins configuration

Set

AT+UTEST=10,3,[<bit_padding>]<pin_seq>

OK

AT+UTEST=10,3,"00000004200000001000"

OK

Output pins definition

Set

AT+UTEST=10,4,[<bit_padding>]<pin_seq>

OK

AT+UTEST=10,4,"00000000100000002000"

OK

Digital testing execution

Set

AT+UTEST=10,5

OK

AT+UTEST=10,5

OK

Digital value measurement

Set

AT+UTEST=10,6

<bit_padding>]<pin_seq>

OK

AT+UTEST=10,6

00000004100000003000

OK

Defined values

ParameterTypeDescription

<op_code>

Number

Test mode setting:

  • 0: restores the pins to the original configuration

  • 2: defines and initializes a set of pins to be tested. The original pins configuration is kept for final restore. In the [<bit_padding>]<pin_seq> parameter use this notation to represent each module pin with its binary digit:

    • 0: the pin will not be tested

    • 1: the pin will be tested (as digital input or output)

  • 3: configures the logical pins previously enabled for testing as output or input; the command has effect only if AT+UTEST=10,2 has been issued.

    If a non-enabled pin is set as digital input or output, the command does not return an error and the setting is not applied. In the [<bit_padding>]<pin_seq> parameter use this notation to represent each module pin with its binary digit:

    • 0: the pin will be set as an output

    • 1: the pin will be set as an input

  • 4: configures the value of the output pins under testing; the command has effect only if AT+UTEST=10,3 has been issued; The command is not mandatory if there are no output pins to configure. In the [<bit_padding>]<pin_seq> parameter use this notation to represent each module pin with its binary digit:

    • 0: the pin will output a "low" logic level

    • 1: the pin will output a "high" logic level

  • 5: applies the setting change defined with <op_code>= 2 / 3 / 4 and triggers the execution of the digital testing. Digital testing of the pins is possible only after the execution of the AT+UTEST=10,5 command.

  • 6: returns the logic value of pins under testing (both input and output); in the [<bit_padding>]<pin_seq> parameter use this notation to represent each module pin with its binary digit:

    • 0: "low" logic digital level measured at the module pin

    • 1: "high" logic digital level measured at the module pin

[<bit_padding>]<pin_seq>

Number

Sequence of hexadecimal digits containing the pin information and the action to execute:

  • See the Notes for detailed number description

Notes

  • The <op_code>, <bit_padding>, <pin_seq> parameters setting is not stored in the NVM.

  • Follow these steps to construct the [<bit_padding>]<pin_seq> sequence:

    1. Consider the number of bits available to select the module’s pins

      • 56 bits

    2. The status of the n-th pin is represented by the corresponding n-th bit; see the <op_code> description for the notation of each mode setting

    3. Convert each group of four binary digits into its hexadecimal representation

  • When a non-testable pin is selected, the command returns an error result code and the value is not considered and not applied.