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+UTEST=0 | ||||||
Modules | LEXI-R10401D-00B LEXI-R10801D-00B | |||||
Attributes | Syntax | PIN required | Settings saved | Can be aborted | Response time | Error reference |
partial | No | No | No |
Enables the production test (or non-signaling) mode or returns to the normal (signaling) operating mode. The AT+UTEST=0 command exits production test mode, while AT+UTEST=1 enters it.
Signaling mode is the default operating state after boot: the protocol stack is operating and the module can connect to the cellular network normally. In non-signaling mode, the module switches off the protocol stack for running tests which could not otherwise be performed.
In signaling mode:
The only allowed +UTEST command is the AT+UTEST=1 used to enable the testing interface
All other +UTEST commands return an error result code (“+CME ERROR: operation not allowed” or “+CME ERROR: 3” depending on the +CMEE AT command setting)
To enter production test mode:
deactivate the protocol stack issuing the AT+CFUN=0
command before
entering the non-signaling mode.
To return to the normal mode, perform one of these actions:
a module reset
power off the module
send AT+UTEST=0
(depending on the module series, a reboot could be
automatically performed)
When the module returns the normal mode, the network registration status
stored in the profile will be restored. Use the AT+CFUN=1
command to
restore the module full functionality.
Type | Syntax | Response | Example |
---|---|---|---|
Generic syntax | |||
Set | AT+UTEST=<mode> | [+UTEST: <mode>] OK | AT+UTEST=0 OK |
Entering normal mode | |||
Set | AT+UTEST=0 | OK | AT+UTEST=0 OK |
Entering test mode | |||
Set | AT+UTEST=1 | OK | AT+UTEST=1 OK |
Read | AT+UTEST? | +UTEST: <mode> OK | +UTEST: 1 OK |
Test | AT+UTEST=? | +UTEST: (list of supported <mode>s) OK | +UTEST: (0-4) OK |
Parameter | Type | Description |
---|---|---|
<mode> | Number | Test mode setting:
|
+UTEST=10 | ||||||
Modules | LEXI-R10401D-00B LEXI-R10801D-00B | |||||
Attributes | Syntax | PIN required | Settings saved | Can be aborted | Response time | Error reference |
partial | No | No | No |
Performs functional testing on the digital pins of the module.
The module pins can be considered as generic digital input / output pins; it is possible to configure one pin as a digital output with “high” logic level and then verify the voltage level present. Conversely, it is possible set a pin as a digital input, externally apply a “high” or “low” logic level, and then check if the module is able to correctly measure the voltage level applied.
This command is intended for production or prototype testing: to check the correct digital pins behavior and to detect possible soldering or functional problems. The execution of these actions is performed only in non-signaling mode. If the module has not been set into non-signaling mode (with AT+UTEST=1) prior to using +UTEST=10, this command will return “+CME ERROR: operation not allowed” or “+CME ERROR: 3” error result code, depending on the +CMEE AT command setting.
Do not exceed the values reported in the Generic Digital Interface section of the module data sheet when testing a pin as a digital input pin, since stressing the device above the listed ratings may cause a permanent damage to the module.
The command only accepts the parameter set supported by the specific module version. When an unsupported parameter is issued, an error result code will be provided (“+CME ERROR: operation not supported” or “+CME ERROR: 4” depending on the +CMEE AT command setting).
For more details on test command examples, guidance about test equipment setup and more information on module reboot see the application development guide and the corresponding data sheet for pins levels characteristics.
Type | Syntax | Response | Example |
---|---|---|---|
Digital pins testing generic syntax | |||
Set | AT+UTEST=10,<op_code>[,[<bit_padding>]<pin_seq>] | OK | AT+UTEST=10,3,"0000001000000300" OK |
Restoring original configuration | |||
Set | AT+UTEST=10,0 | OK | AT+UTEST=10,0 OK |
Pins set definition | |||
Set | AT+UTEST=10,2,[<bit_padding>]<pin_seq> | OK | AT+UTEST=10,2,"0000000C300000003000" OK |
Pins configuration | |||
Set | AT+UTEST=10,3,[<bit_padding>]<pin_seq> | OK | AT+UTEST=10,3,"00000004200000001000" OK |
Output pins definition | |||
Set | AT+UTEST=10,4,[<bit_padding>]<pin_seq> | OK | AT+UTEST=10,4,"00000000100000002000" OK |
Digital testing execution | |||
Set | AT+UTEST=10,5 | OK | AT+UTEST=10,5 OK |
Digital value measurement | |||
Set | AT+UTEST=10,6 | <bit_padding>]<pin_seq> OK | AT+UTEST=10,6 00000004100000003000 OK |
Parameter | Type | Description |
---|---|---|
<op_code> | Number | Test mode setting:
|
[<bit_padding>]<pin_seq> | Number | Sequence of hexadecimal digits containing the pin information and the action to execute:
|
The <op_code>, <bit_padding>, <pin_seq> parameters setting is not stored in the NVM.
Follow these steps to construct the [<bit_padding>]<pin_seq> sequence:
Consider the number of bits available to select the module’s pins
56 bits
The status of the n-th pin is represented by the corresponding n-th bit; see the <op_code> description for the notation of each mode setting
Convert each group of four binary digits into its hexadecimal representation
When a non-testable pin is selected, the command returns an error result code and the value is not considered and not applied.